Azərbaycan Milli Elmlər Akademiyası
İnsan resursları və elmmetrik məlumatlar bazası
İnsan resursları və elmmetrik məlumatlar bazası
İstinad formatları:
Qeyd: Əgər DOI məlumdursa, "?????" hissəsini müvafiq DOI ilə əvəz edin. Əgər məlum deyilsə, həmin hissəni silin.
-
APA: Huseynov, E., Garibov, A., & Mehdiyeva, R.. (2016). TEM and SEM study of nano SiO2 particles exposed to influence of neutron flux. Journal of Materials Research and Technology, 5(3), 213–218. doi: ?????
-
AMA: [1]Huseynov E, Garibov A, Mehdiyeva R. TEM and SEM study of nano SiO2 particles exposed to influence of neutron flux. Journal of Materials Research and Technology. 2016;5(3):213-218. doi:?????
-
Chicago: Huseynov, Elchin, Adil Garibov, and Ravan Mehdiyeva. ‘TEM and SEM Study of Nano SiO2 Particles Exposed to Influence of Neutron Flux’. Journal of Materials Research and Technology 5, no. 3 (1 July 2016): 213–18. Accesseddoi:?????.
-
IEEE: [1]E. Huseynov, A. Garibovand R. Mehdiyeva, “TEM and SEM study of nano SiO2 particles exposed to influence of neutron flux”, Journal of Materials Research and Technology, vol. 5, no. 3, pp. 213–218, Jul. 2016, doi: ?????. Available: https://www.sciencedirect.com/science/article/pii/S2238785415001106
-
ISNAD: Huseynov, Elchin - Garibov, Adil - Mehdiyeva, Ravan. “TEM and SEM Study of Nano SiO2 Particles Exposed to Influence of Neutron Flux”. Journal of Materials Research and Technology 5/3 (July 1, 2016): 213–218. https://doi.org/?????.
-
Elsevier: [1]Huseynov E, Garibov A, Mehdiyeva R. TEM and SEM study of nano SiO2 particles exposed to influence of neutron flux. Journal of Materials Research and Technology 2016;5:213–8. https://doi.org/?????.
-
MLA: Huseynov, E., et al.. “TEM and SEM Study of Nano SiO2 Particles Exposed to Influence of Neutron Flux”. Journal of Materials Research and Technology, vol. 5, no. 3, Jul. 2016, pp. 213–18, https://doi.org/?????.
-
Vancouver: 1.Huseynov E, Garibov A, Mehdiyeva R. TEM and SEM study of nano SiO2 particles exposed to influence of neutron flux. Journal of Materials Research and Technology [Internet]. 2016Jul1;5(3):213–8. Available from: https://www.sciencedirect.com/science/article/pii/S2238785415001106