Azərbaycan Milli Elmlər Akademiyası
İnsan resursları və elmmetrik məlumatlar bazası
İnsan resursları və elmmetrik məlumatlar bazası
İstinad formatları:
Qeyd: Əgər DOI məlumdursa, "?????" hissəsini müvafiq DOI ilə əvəz edin. Əgər məlum deyilsə, həmin hissəni silin.
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APA: Huseynov, E., Garibov, A., Mehdiyeva, R., & Huseynova, E.. (2018). Effects of neutron flux, frequency and temperature on the dielectric loss of nano SiO2 particles. Silicon, 10(2), 191–196. doi: ?????
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AMA: [1]Huseynov E, Garibov A, Mehdiyeva R, Huseynova E. Effects of neutron flux, frequency and temperature on the dielectric loss of nano SiO2 particles. Silicon. 2018;10(2):191-196. doi:?????
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Chicago: Huseynov, Elchin, Adil Garibov, Ravan Mehdiyeva, and Efsane Huseynova. ‘Effects of Neutron Flux, Frequency and Temperature on the Dielectric Loss of Nano SiO2 Particles’. Silicon 10, no. 2 (1 March 2018): 191–96. Accesseddoi:?????.
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IEEE: [1]E. Huseynov, A. Garibov, R. Mehdiyevaand E. Huseynova, “Effects of neutron flux, frequency and temperature on the dielectric loss of nano SiO2 particles”, Silicon, vol. 10, no. 2, pp. 191–196, Mar. 2018, doi: ?????. Available: https://link.springer.com/article/10.1007/s12633-016-9411-2
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ISNAD: Huseynov, Elchin - Garibov, Adil - Mehdiyeva, Ravan - Huseynova, Efsane. “Effects of Neutron Flux, Frequency and Temperature on the Dielectric Loss of Nano SiO2 Particles”. Silicon 10/2 (March 1, 2018): 191–196. https://doi.org/?????.
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Elsevier: [1]Huseynov E, Garibov A, Mehdiyeva R, Huseynova E. Effects of neutron flux, frequency and temperature on the dielectric loss of nano SiO2 particles. Silicon 2018;10:191–6. https://doi.org/?????.
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MLA: Huseynov, E., et al.. “Effects of Neutron Flux, Frequency and Temperature on the Dielectric Loss of Nano SiO2 Particles”. Silicon, vol. 10, no. 2, Mar. 2018, pp. 191–96, https://doi.org/?????.
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Vancouver: 1.Huseynov E, Garibov A, Mehdiyeva R, Huseynova E. Effects of neutron flux, frequency and temperature on the dielectric loss of nano SiO2 particles. Silicon [Internet]. 2018Mar1;10(2):191–6. Available from: https://link.springer.com/article/10.1007/s12633-016-9411-2