Azərbaycan Milli Elmlər Akademiyası
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Qeyd: Əgər DOI məlumdursa, "?????" hissəsini müvafiq DOI ilə əvəz edin. Əgər məlum deyilsə, həmin hissəni silin.

APA: Hashimov, A., Camalov, M., Akin, F., Arikan, O., Orucov, A., & Guliyev, M.. (2024). The degradation analysis of XLPE materials under thermal aging: a comprehensive study through partial discharge measurements and structural characterization techniques. Transactions on Electrical and Electronic Materials, 25(4), 494–506. doi: ?????
AMA: [1]Hashimov A, Camalov M, Akin F, Arikan O, Orucov A, Guliyev M. The degradation analysis of XLPE materials under thermal aging: a comprehensive study through partial discharge measurements and structural characterization techniques. Transactions on Electrical and Electronic Materials. 2024;25(4):494-506. doi:?????
Chicago: Hashimov, Arif, Mehti Camalov, Firat Akin, Oktay Arikan, Allahverdi Orucov, and Musafir Guliyev. ‘The Degradation Analysis of XLPE Materials Under Thermal Aging: A Comprehensive Study Through Partial Discharge Measurements and Structural Characterization Techniques’. Transactions on Electrical and Electronic Materials 25, no. 4 (1 August 2024): 494–506. Accesseddoi:?????.
IEEE: [1]A. Hashimov, M. Camalov, F. Akin, O. Arikan, A. Orucovand M. Guliyev, “The degradation analysis of XLPE materials under thermal aging: a comprehensive study through partial discharge measurements and structural characterization techniques”, Transactions on Electrical and Electronic Materials, vol. 25, no. 4, pp. 494–506, Aug. 2024, doi: ?????. Available: https://link.springer.com/article/10.1007/s42341-024-00533-4
ISNAD: Hashimov, Arif - Camalov, Mehti - Akin, Firat - Arikan, Oktay - Orucov, Allahverdi - Guliyev, Musafir. “The Degradation Analysis of XLPE Materials Under Thermal Aging: A Comprehensive Study Through Partial Discharge Measurements and Structural Characterization Techniques”. Transactions on Electrical and Electronic Materials 25/4 (August 1, 2024): 494–506. https://doi.org/?????.
Elsevier: [1]Hashimov A, Camalov M, Akin F, Arikan O, Orucov A, Guliyev M. The degradation analysis of XLPE materials under thermal aging: a comprehensive study through partial discharge measurements and structural characterization techniques. Transactions on Electrical and Electronic Materials 2024;25:494–506. https://doi.org/?????.
MLA: Hashimov, A., et al.. “The Degradation Analysis of XLPE Materials Under Thermal Aging: A Comprehensive Study Through Partial Discharge Measurements and Structural Characterization Techniques”. Transactions on Electrical and Electronic Materials, vol. 25, no. 4, Aug. 2024, pp. 494–506, https://doi.org/?????.
Vancouver: 1.Hashimov A, Camalov M, Akin F, Arikan O, Orucov A, Guliyev M. The degradation analysis of XLPE materials under thermal aging: a comprehensive study through partial discharge measurements and structural characterization techniques. Transactions on Electrical and Electronic Materials [Internet]. 2024Aug1;25(4):494–506. Available from: https://link.springer.com/article/10.1007/s42341-024-00533-4