Azərbaycan Milli Elmlər Akademiyası
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Qeyd: Əgər DOI məlumdursa, "?????" hissəsini müvafiq DOI ilə əvəz edin. Əgər məlum deyilsə, həmin hissəni silin.

APA: Tagiyev, D., Salakhova, E., Kalantarova, P., & Khankishiyeva, N.. (2016). INVESTIGATION OF VOLTAMPERE CHARACTERISTICS OF DIODIC STRUCTURE ON BASE OF THIN FILMS OF RHENIUM CHALCOGENIDES. INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY, 795–802. doi: ?????
AMA: [1]Tagiyev D, Salakhova E, Kalantarova P, Khankishiyeva N. INVESTIGATION OF VOLTAMPERE CHARACTERISTICS OF DIODIC STRUCTURE ON BASE OF THIN FILMS OF RHENIUM CHALCOGENIDES. INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY. 2016:795-802. doi:?????
Chicago: Tagiyev, DB, EA Salakhova, PE Kalantarova, and NN Khankishiyeva. ‘INVESTIGATION OF VOLTAMPERE CHARACTERISTICS OF DIODIC STRUCTURE ON BASE OF THIN FILMS OF RHENIUM CHALCOGENIDES’. INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY (1 January 2016): 795–802. Accesseddoi:?????.
IEEE: [1]D. Tagiyev, E. Salakhova, P. Kalantarovaand N. Khankishiyeva, “INVESTIGATION OF VOLTAMPERE CHARACTERISTICS OF DIODIC STRUCTURE ON BASE OF THIN FILMS OF RHENIUM CHALCOGENIDES”, INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY, pp. 795–802, Jan. 2016, doi: ?????
ISNAD: Tagiyev, DB - Salakhova, EA - Kalantarova, PE - Khankishiyeva, NN. “INVESTIGATION OF VOLTAMPERE CHARACTERISTICS OF DIODIC STRUCTURE ON BASE OF THIN FILMS OF RHENIUM CHALCOGENIDES”. INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY (January 1, 2016): 795–802. https://doi.org/?????.
Elsevier: [1]Tagiyev D, Salakhova E, Kalantarova P, Khankishiyeva N. INVESTIGATION OF VOLTAMPERE CHARACTERISTICS OF DIODIC STRUCTURE ON BASE OF THIN FILMS OF RHENIUM CHALCOGENIDES. INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY 2016:795–802. https://doi.org/?????.
MLA: Tagiyev, D., et al.. “INVESTIGATION OF VOLTAMPERE CHARACTERISTICS OF DIODIC STRUCTURE ON BASE OF THIN FILMS OF RHENIUM CHALCOGENIDES”. INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY, Jan. 2016, pp. 795–802, https://doi.org/?????.
Vancouver: 1.Tagiyev D, Salakhova E, Kalantarova P, Khankishiyeva N. INVESTIGATION OF VOLTAMPERE CHARACTERISTICS OF DIODIC STRUCTURE ON BASE OF THIN FILMS OF RHENIUM CHALCOGENIDES. INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY [Internet]. 2016Jan1;:795–802.