Azərbaycan Milli Elmlər Akademiyası
İnsan resursları və elmmetrik məlumatlar bazası
İnsan resursları və elmmetrik məlumatlar bazası
İstinad formatları:
Qeyd: Əgər DOI məlumdursa, "?????" hissəsini müvafiq DOI ilə əvəz edin. Əgər məlum deyilsə, həmin hissəni silin.
-
APA: T.A., A.. (2006). Fundamentals of interference monitoring of the defect origin beginning. Automatic Control Ahd Computer Sciences, Aller-ton Press, Inc., New York, (5), 12–24. doi: ?????
-
AMA: [1]T.A. A. Fundamentals of interference monitoring of the defect origin beginning. Automatic Control ahd Computer Sciences, Aller-ton Press, Inc, New York. 2006;(5):12-24. doi:?????
-
Chicago: T.A., Aliev. ‘Fundamentals of Interference Monitoring of the Defect Origin Beginning’. Automatic Control Ahd Computer Sciences, Aller-ton Press, Inc., New York no. 5 (1 January 2006): 12–24. Accesseddoi:?????.
-
IEEE: [1]A. T.A., “Fundamentals of interference monitoring of the defect origin beginning”, Automatic Control ahd Computer Sciences, Aller-ton Press, Inc., New York, no. 5, pp. 12–24, Jan. 2006, doi: ?????
-
ISNAD: T.A., Aliev. “Fundamentals of Interference Monitoring of the Defect Origin Beginning”. Automatic Control ahd Computer Sciences, Aller-ton Press, Inc., New York 5 (January 1, 2006): 12–24. https://doi.org/?????.
-
Elsevier: [1]T.A. A. Fundamentals of interference monitoring of the defect origin beginning. Automatic Control Ahd Computer Sciences, Aller-ton Press, Inc, New York 2006:12–24. https://doi.org/?????.
-
MLA: T.A., A.. “Fundamentals of Interference Monitoring of the Defect Origin Beginning”. Automatic Control Ahd Computer Sciences, Aller-ton Press, Inc., New York, no. 5, Jan. 2006, pp. 12–24, https://doi.org/?????.
-
Vancouver: 1.T.A. A. Fundamentals of interference monitoring of the defect origin beginning. Automatic Control ahd Computer Sciences, Aller-ton Press, Inc, New York [Internet]. 2006Jan1;(5):12–24.