Azərbaycan Milli Elmlər Akademiyası
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Qeyd: Əgər DOI məlumdursa, "?????" hissəsini müvafiq DOI ilə əvəz edin. Əgər məlum deyilsə, həmin hissəni silin.

APA: Aliev, T., & Aliev, E.. (2007). Technology of noise analysis and monitoring of defect origin. Appl Comput Math, 6(2), 246–252. doi: ?????
AMA: [1]Aliev T, Aliev E. Technology of noise analysis and monitoring of defect origin. Appl Comput Math. 2007;6(2):246-252. doi:?????
Chicago: Aliev, Telman, and Elchin Aliev. ‘Technology of Noise Analysis and Monitoring of Defect Origin’. Appl Comput Math 6, no. 2 (1 January 2007): 246–52. Accesseddoi:?????.
IEEE: [1]T. Aliev and E. Aliev, “Technology of noise analysis and monitoring of defect origin”, Appl Comput Math, vol. 6, no. 2, pp. 246–252, Jan. 2007, doi: ?????. Available: https://scholar.google.com/scholar?cluster=10747789314385853511&hl=en&oi=scholarr
ISNAD: Aliev, Telman - Aliev, Elchin. “Technology of Noise Analysis and Monitoring of Defect Origin”. Appl Comput Math 6/2 (January 1, 2007): 246–252. https://doi.org/?????.
Elsevier: [1]Aliev T, Aliev E. Technology of noise analysis and monitoring of defect origin. Appl Comput Math 2007;6:246–52. https://doi.org/?????.
MLA: Aliev, T.and E. Aliev. “Technology of Noise Analysis and Monitoring of Defect Origin”. Appl Comput Math, vol. 6, no. 2, Jan. 2007, pp. 246–52, https://doi.org/?????.
Vancouver: 1.Aliev T, Aliev E. Technology of noise analysis and monitoring of defect origin. Appl Comput Math [Internet]. 2007Jan1;6(2):246–52. Available from: https://scholar.google.com/scholar?cluster=10747789314385853511&hl=en&oi=scholarr