Azərbaycan Milli Elmlər Akademiyası
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Qeyd: Əgər DOI məlumdursa, "?????" hissəsini müvafiq DOI ilə əvəz edin. Əgər məlum deyilsə, həmin hissəni silin.

APA: Aliev, T., & Aliev, E.. (2007). Interference Technology of Early Control of Defect Origin in Technical Objects. IISE Annual Conference. Proceedings, 682. doi: ?????
AMA: [1]Aliev T, Aliev E. Interference Technology of Early Control of Defect Origin in Technical Objects. IISE Annual Conference Proceedings. 2007:682. doi:?????
Chicago: Aliev, Telman, and Elchin Aliev. ‘Interference Technology of Early Control of Defect Origin in Technical Objects’. IISE Annual Conference. Proceedings (1 January 2007): 682. Accesseddoi:?????.
IEEE: [1]T. Aliev and E. Aliev, “Interference Technology of Early Control of Defect Origin in Technical Objects”, IISE Annual Conference. Proceedings, p. 682, Jan. 2007, doi: ?????. Available: https://search.proquest.com/openview/32e18d1e9b1e0bdbef7515f2a3f5f145/1?pq-origsite=gscholar&cbl=51908
ISNAD: Aliev, Telman - Aliev, Elchin. “Interference Technology of Early Control of Defect Origin in Technical Objects”. IISE Annual Conference. Proceedings (January 1, 2007): 682. https://doi.org/?????.
Elsevier: [1]Aliev T, Aliev E. Interference Technology of Early Control of Defect Origin in Technical Objects. IISE Annual Conference Proceedings 2007:682. https://doi.org/?????.
MLA: Aliev, T.and E. Aliev. “Interference Technology of Early Control of Defect Origin in Technical Objects”. IISE Annual Conference. Proceedings, Jan. 2007, p. 682, https://doi.org/?????.
Vancouver: 1.Aliev T, Aliev E. Interference Technology of Early Control of Defect Origin in Technical Objects. IISE Annual Conference Proceedings [Internet]. 2007Jan1;:682. Available from: https://search.proquest.com/openview/32e18d1e9b1e0bdbef7515f2a3f5f145/1?pq-origsite=gscholar&cbl=51908