Azərbaycan Milli Elmlər Akademiyası
İnsan resursları və elmmetrik məlumatlar bazası

İstinad formatları:

Qeyd: Əgər DOI məlumdursa, "?????" hissəsini müvafiq DOI ilə əvəz edin. Əgər məlum deyilsə, həmin hissəni silin.

APA: Aliev, T.. (2007). Position-Binary Technology of Monitoring Defect at its Origin. Digital Noise Monitoring of Defect Origin, 23–41. doi: ?????
AMA: [1]Aliev T. Position-Binary Technology of Monitoring Defect at its Origin. Digital Noise Monitoring of Defect Origin. 2007:23-41. doi:?????
Chicago: Aliev, Telman. ‘Position-Binary Technology of Monitoring Defect at Its Origin’. Digital Noise Monitoring of Defect Origin (1 January 2007): 23–41. Accesseddoi:?????.
IEEE: [1]T. Aliev, “Position-Binary Technology of Monitoring Defect at its Origin”, Digital Noise Monitoring of Defect Origin, pp. 23–41, Jan. 2007, doi: ?????. Available: https://scholar.google.com/scholar?cluster=7270034528618070024&hl=en&oi=scholarr
ISNAD: Aliev, Telman. “Position-Binary Technology of Monitoring Defect at Its Origin”. Digital Noise Monitoring of Defect Origin (January 1, 2007): 23–41. https://doi.org/?????.
Elsevier: [1]Aliev T. Position-Binary Technology of Monitoring Defect at its Origin. Digital Noise Monitoring of Defect Origin 2007:23–41. https://doi.org/?????.
MLA: Aliev, T.. “Position-Binary Technology of Monitoring Defect at Its Origin”. Digital Noise Monitoring of Defect Origin, Jan. 2007, pp. 23–41, https://doi.org/?????.
Vancouver: 1.Aliev T. Position-Binary Technology of Monitoring Defect at its Origin. Digital Noise Monitoring of Defect Origin [Internet]. 2007Jan1;:23–41. Available from: https://scholar.google.com/scholar?cluster=7270034528618070024&hl=en&oi=scholarr