Azərbaycan Milli Elmlər Akademiyası
İnsan resursları və elmmetrik məlumatlar bazası

İstinad formatları:

Qeyd: Əgər DOI məlumdursa, "?????" hissəsini müvafiq DOI ilə əvəz edin. Əgər məlum deyilsə, həmin hissəni silin.

APA: Aliev, T.. (2007). The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier. Digital Noise Monitoring of Defect Origin, 163–216. doi: ?????
AMA: [1]Aliev T. The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier. Digital Noise Monitoring of Defect Origin. 2007:163-216. doi:?????
Chicago: Aliev, Telman. ‘The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier’. Digital Noise Monitoring of Defect Origin (1 January 2007): 163–216. Accesseddoi:?????.
IEEE: [1]T. Aliev, “The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier”, Digital Noise Monitoring of Defect Origin, pp. 163–216, Jan. 2007, doi: ?????. Available: https://scholar.google.com/scholar?cluster=5927681401043797589&hl=en&oi=scholarr
ISNAD: Aliev, Telman. “The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier”. Digital Noise Monitoring of Defect Origin (January 1, 2007): 163–216. https://doi.org/?????.
Elsevier: [1]Aliev T. The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier. Digital Noise Monitoring of Defect Origin 2007:163–216. https://doi.org/?????.
MLA: Aliev, T.. “The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier”. Digital Noise Monitoring of Defect Origin, Jan. 2007, pp. 163–216, https://doi.org/?????.
Vancouver: 1.Aliev T. The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier. Digital Noise Monitoring of Defect Origin [Internet]. 2007Jan1;:163–216. Available from: https://scholar.google.com/scholar?cluster=5927681401043797589&hl=en&oi=scholarr